The Infona portal uses cookies, i.e. strings of text saved by a browser on the user's device. The portal can access those files and use them to remember the user's data, such as their chosen settings (screen view, interface language, etc.), or their login data. By using the Infona portal the user accepts automatic saving and using this information for portal operation purposes. More information on the subject can be found in the Privacy Policy and Terms of Service. By closing this window the user confirms that they have read the information on cookie usage, and they accept the privacy policy and the way cookies are used by the portal. You can change the cookie settings in your browser.
Scan-based design-for-testability (DFT) structure is widely used to facilitate the testing of integrated circuits (ICs). However, it always incurs much test power consumption. In this paper, we propose an improved test power optimization method by inserting extra logic in scan chain. It explores suitable places in scan chain based on an accurate criterion to insert different linear functions so as...
In interposer-based 2.5D integrated circuits, the passive silicon interposer is the least expensive component in the chip. Thus, it is desirable to test the interposer before bonding to ensure that more expensive and defect-free dies are not stacked on a faulty interposer. We present an efficient method to locate defects in a passive interposer before stacking. The proposed test architecture uses...
This paper investigates the thermal cross-talk between the powered microbumps under one chip and the un-powered microbumps under the neighboring chip. Both chips were on a Si interposer for 2.5D IC. The Joule heating from the powered chip was found to be transferred laterally along the interposer to the unpowered chip and produced a temperature gradient in the microbumps in the unpowered chip. Void...
Interdependence of the clocking architecture across IPs and overall peak power consumption is a major bottleneck that prevents concurrent yet independent testing of an IP at a higher clock frequency. We use a dynamic clocking architecture that eliminates these dependencies and reduces peak shift power by using clock phase staggering at a granular level during system-on-chip (SoC) testing. A SoC design...
For the development of lifetime models in a physics-of-failure approach for microelectronic devices and functional elements on the submicron or even nanoscopic scale, the exact knowledge of the materials in use and their failure behavior is imperative. A piezoresistive MEMS force sensor, which can be integrated in MEMS sized tensile and fatigue test stages, was developed and is characterized using...
Duplication, misrouting, and dropping of packets due to short faults on network-on-chip (NoC) interconnects have become a burden and significant impact on performance metrics. This paper proposes an adaptive approach that detects and locates intra-channel short faults on NoC interconnects, and accounts impact of the faults on performance metrics. The model is scalable with all NoCs. Simulations show...
Spoofing is a technique to bias the system decisions towards target speakers without the physical presence of genuines. The focus of spoofing is on target speakers, resulting a sharp increase in false acceptance. The availability of high quality recording and playback devices (i.e. smart phones), have made spoof attacks by replay data a most common and easy approach, even without much knowledge about...
We present the results of single event effect (SEE) testing and analysis investigating the effects of radiation on electronics. This paper is a summary of test results.
This paper examines the single-event upset response of the Xilinx UltraScale Soft Error Mitigation (SEM IP) software tool irradiated with a 64MeV proton source. The SEM SEU results are then compared to accelerated particle testing results for the Xilinx 20nm Kintex family, collected at LANSCE and Crocker, to evaluate its capability to detect & collect SEU accurately. Furthermore, Xilinx 20nm...
The Open Directory Project (ODP) is a large scale, high quality and publicly available web directory. Many studies and real-world applications build on an ODP-based classifier. However, existing approaches use traditional bag-of-words representation of text to develop an ODP-based classifier and words alone do not always provide atomic units of semantic meaning. In this paper, we propose a novel framework...
In large population speaker identification (SI) system, likelihood computations during testing stage can be time-consuming. In such a case, clustering method is applied to this situation. But the traditional clustering algorithm based on K-means is sensitive to the randomly chosen initial cluster centers. To address this issue, the paper proposes an improved clustering algorithm which uses an initial...
Our aim in this work is to emphasize the immunity behavior of the GaAs/Si heterostructure against the defects degradation. The main objective of this paper is to propose a new modeling approach using an Adaptive Network based Fuzzy Inference System (ANFIS) to investigate the electrical performance of GaAs/Si solar cell including the interface defects generated by the large lattice mismatch between...
Regression testing of a large test pool consistently needs a prioritization technique that caters requirements changes. Conventional prioritization techniques cover only the methods to find the ideal ordering of test cases neglecting requirement changes. In this paper, we propose string dissimilarity-based priority assignment to test cases through the combination of classical and non-classical textual...
Decomposition of the time reversal operator (DORT) recently adopted to wiring fault detection and localization presented effectual results when dealing with a single soft fault along with complex network configurations. On the other hand, it failed in handling the task of locating multiple faults within even simple ones. In this paper, we propose an enhanced version of the standard DORT technique...
This paper reports the avalanche capabilities of commercial 1.2 kV SiC MOSFETs. Various non-repetitive avalanche conditions, such as current, energy, and time in avalanche, were tested in order to fully evaluate the ruggedness of the SiC MOSFETs. From this testing, a boundary was drawn to identify the typical avalanche ruggedness of each device. It was shown that, unlike similarly-rated Si CoolMOS...
By learning from the past behaviors of user transaction records, recommender systems can help people to nd interesting products from many other products. In a collaborative ltering based recommender system, products are regarded as features. However, there are usually quite a lot of products to be considered. A recommender system would be very inefficient if such a large number of products are processed...
In a load-sharing system, total workload is shared by all components and failure of one component increases workload of the surviving ones. The time interval between two consecutive component failures reflects component reliability under different workloads and is of interest to us. This study develops some methods to derive both exact and approximate confidence intervals for parameters in load-sharing...
Many of the tools used today in semiconductor test engineering are single-point solutions that are concerned with the mechanics of translating test IP between domains and formats. There is no cohesive standardized framework to bind them all together; and workflow and application architecture choices are largely left up to the individual engineer. Learning from the state-of-the-art in other software...
The number of bumps that are touched during probe is a key factor in the cost of a probe card. DFT techniques have been commonly used to reduce the number of signal bumps that need to be probed, but the vast majority of bumps in a typical SoC are allocated to core power and ground. In this paper we describe a technique using power supply noise simulations to develop special bump masks that reduce...
Due to the recent 3He shortage, numerous alternative neutron conversion materials have emerged as potential 3He replacements. One such material is lithium-borosilicate aerogel which, unlike substrates coated with a neutron conversion material, is composed of the neutron conversion materials (Li and B) which are contained within the aerogel structural matrix. Additionally, silica-based aerogels can...
Set the date range to filter the displayed results. You can set a starting date, ending date or both. You can enter the dates manually or choose them from the calendar.