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IEEE Transactions on Power Electronics > 2018 > 33 > 1 > 13 - 17
IEEE Transactions on Power Electronics > 2018 > 33 > 1 > 581 - 594
IEEE Transactions on Power Electronics > 2018 > 33 > 1 > 283 - 298
IEEE Transactions on Computer-Aided Design of Integrated Circuits and... > 2018 > 37 > 1 > 245 - 256
IEEE Transactions on Circuits and Systems II: Express Briefs > 2018 > 65 > 1 > 106 - 110
IEEE Transactions on Circuits and Systems II: Express Briefs > 2018 > 65 > 1 > 46 - 50
IEEE Transactions on Computer-Aided Design of Integrated Circuits and... > 2018 > 37 > 1 > 182 - 192
IEEE Transactions on Power Electronics > 2018 > 33 > 1 > 240 - 247
IEEE Transactions on Power Electronics > 2018 > 33 > 1 > 248 - 258
IEEE Transactions on Electron Devices > 2018 > 65 > 1 > 129 - 135
IEEE Transactions on Circuits and Systems II: Express Briefs > 2018 > 65 > 1 > 11 - 15
IEEE Transactions on Circuits and Systems II: Express Briefs > 2018 > 65 > 1 > 1 - 5
IEEE Transactions on Cybernetics > 2017 > 47 > 12 > 4025 - 4037
IEEE Systems Journal > 2017 > 11 > 4 > 2718 - 2725
IEEE Transactions on Electron Devices > 2017 > 64 > 12 > 4882 - 4888
IEEE Transactions on Electron Devices > 2017 > 64 > 12 > 4868 - 4874
IEEE/ACM Transactions on Audio, Speech, and Language Processing > 2017 > 25 > 12 > 2424 - 2432
IEEE Transactions on Device and Materials Reliability > 2017 > 17 > 4 > 692 - 697
IEEE Design & Test > 2017 > 34 > 6 > 54 - 62