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IEEE Transactions on Computer-Aided Design of Integrated Circuits and... > 2016 > 35 > 3 > 499 - 512
IEEE Transactions on Industry Applications > 2016 > 52 > 2 > 1280 - 1284
IEEE Transactions on Instrumentation and Measurement > 2016 > 65 > 2 > 399 - 406
IEEE Transactions on Computer-Aided Design of Integrated Circuits and... > 2016 > 35 > 1 > 141 - 154
IEEE Transactions on Very Large Scale Integration (VLSI) Systems > 2016 > 24 > 1 > 393 - 397
IEEE Transactions on Computer-Aided Design of Integrated Circuits and... > 2016 > 35 > 1 > 155 - 165
IEEE Transactions on Computer-Aided Design of Integrated Circuits and... > 2015 > 34 > 12 > 2013 - 2024
IEEE Transactions on Computer-Aided Design of Integrated Circuits and... > 2015 > 34 > 11 > 1718 - 1729
IEEE Transactions on Computer-Aided Design of Integrated Circuits and... > 2015 > 34 > 11 > 1860 - 1872
2015 IEEE AUTOTESTCON > 339 - 344