Wyniki wyszukiwania
IEEE Transactions on Electron Devices > 2017 > 64 > 12 > 5057 - 5064
IEEE Transactions on Power Electronics > 2017 > 32 > 10 > 7414 - 7418
IEEE Transactions on Industrial Electronics > 2017 > 64 > 1 > 206 - 216
IEEE Transactions on Reliability > 2016 > 65 > 1 > 248 - 255
IEEE Sensors Journal > 2016 > 16 > 1 > 43 - 52
IEEE Transactions on Device and Materials Reliability > 2015 > 15 > 3 > 467 - 471
IEEE Transactions on Nanotechnology > 2015 > 14 > 4 > 768 - 775
IEEE Transactions on Nuclear Science > 2014 > 61 > 3-2 > 1420 - 1425
IEEE Transactions on Circuits and Systems I: Regular Papers > 2014 > 61 > 8 > 2318 - 2325
IEEE Transactions on Electron Devices > 2014 > 61 > 5 > 1464 - 1469
IEEE Transactions on Electron Devices > 2014 > 61 > 3 > 688 - 695
IEEE Transactions on Nanotechnology > 2013 > 12 > 6 > 945 - 947
IEEE Electron Device Letters > 2012 > 33 > 5 > 643 - 645
IEEE Transactions on Nuclear Science > 2012 > 59 > 6-2 > 3249 - 3257
IEEE Transactions on Nuclear Science > 2012 > 59 > 6-1 > 3021 - 3026
IEEE Transactions on Nuclear Science > 2011 > 58 > 3-2 > 870 - 876
IEEE Transactions on Electron Devices > 2011 > 58 > 7 > 1830 - 1836
IEEE Transactions on Electron Devices > 2011 > 58 > 2 > 433 - 440
IEEE Transactions on Electron Devices > 2011 > 58 > 4 > 931 - 937
IEEE Electron Device Letters > 2011 > 32 > 6 > 746 - 748