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In this paper, a novel power system module (PSM) is developed by integrating the vertical input capacitor inside the package. Comparing with the traditional PSM, the novel PSM has better electrical performance with less parasitic inductance and switching loss, due to a small loop from the input capacitor to the MOSFETs. A comprehensive modeling study is carried out to assess the assembly stress, thermal...
In this paper, a comprehensive modeling is carried out to investigate the dynamic behaviors of WL-CSP subjected to both flat and vertical drop impacts. The non-linear dynamic properties include solder, Cu pad and the metal stacking under the UBM. Both of the JEDEC standard flat drop test and the vertical drop test modeling for different solder bump height are studied. The results showed that, in the...
The magnitude of the I/O requirements for modern ICs continues to increase due to the growing complexity and size of ICs. The large I/O count found on most ICs have forced most designers to use flip-chip packaging instead of wire bonded packaging. Unfortunately, the solder bumps in flip-chip packages are susceptible to failure, especially in the presence of high temperatures which can cause large...
For power module, the reliability evaluation of thermal fatigue life by power cycling has been prioritized as an important concern. Since in power cycling produces there exists non-uniform temperature distribution in the power module, coupled thermal-structure analysis is required to evaluate thermal fatigue mechanism. The thermal expansion difference between a Si chip and a substrate causes thermal...
Through-silicon-via (TSV) technology permits devices to be placed and wired in the third dimension. Currently, there is a strong motivation for the semiconductor industry to move to 3-D integration using the TSV approach due to many advantages of TSV application. However, there are also some challenges for stacked die package with TSVs. One of the challenges is thermo-mechanical reliability of multi-layer...
Unlike other electronic component manufacturers, many LED manufacturers do not provide board-level thermal cycling test results as a part of the part information. The users of LEDs need to determine the durability of solder joints under their application conditions and circuit board material and geometry. Simulation of solder joint reliability can help system developers to make design decisions. The...
3D packaging is one of the main emerging markets especially for mobile application within the last view years. Mobile devices are exposed and hence need to be reliable under to vibration or mechanical shock conditions. Therefore, material properties covering strain rate dependency have to be at hand within reliability studies. Miniature bulk specimens were utilized to gain stress and strain data at...
The study aims to predict the life and assess the reliability of electronic packages subject to multiple drop-impacts. Engineers used to adopt mechanics analysis as well as a certain life prediction model to predict the impact life of the package, and it is usually a deterministic value. However, drop test results show that the impact life of the package is not a single deterministic value but scatters...
This study describes board-level drop reliability of TFBGA subjected to JEDEC drop test condition which features an impact pulse profile with a peak acceleration of 1500G and a pulse duration of 0.5 ms. The solder ball is assumed as an elastoplastic model, and the other components are assumed to be linear elastic models. Both the global/local finite element method and the finite grid region method...
A global/local method along with an optimization algorithm, so called the modified sub-modeling approach of the optimal equivalent solder is introduced as a simple but effective approach to predict the deformation and the reliability in the package. The viewpoint of equivalent solder in this method is facilitated to obviously reduce the number of elements/nodes so as to enhance computing accuracy...
Transition to Pb-free has necessitated the requirement for study on the reliability of mixed assemblies. Mixed assemblies are bound to be used during the transition period and beyond the deadline as well. Processing and reliability issues with Pb-free manufacturing have forced the exemption of certain product categories from the legislations banning the use of lead. Hence, the use of mixed assemblies...
The demand for flip chip devices is rising to meet increasingly strict requirements for smaller package size, multiple-die stacking and higher interconnection densities. There are, however, two major issues facing the flip chip process, which are reliability impact by the stresses induced in the solder joints during reflow and high cost for underfill process and materials. Current alternatives to...
The ever increasing power density in high performance microelectronic devices for large business computing and telecommunication infrastructure has led to several new reliability challenges for solder interconnects. One of them is the creep collapse and bridging of ball grid array (BGA) solder joints under heatsink compressive loads. In this study, the effect of heatsinking compressive load on the...
The effects of material properties modeling on the solder failure analyses by numerical simulations are studied. The packaging structure of plastic ball grid array on printed circuit board was modeled. Two different types of molding compounds and two different types of substrates were employed and combined for the plastic ball grid array package modeling. The material properties were assumed as temperature...
Although single die eWLB has been around for quite some time, processing of multi-die packages can pose many challenges. In multi-die eWLB package, two or more dies are placed side by side with a small gap, encapsulated by mold compound and interconnected with redistributed layers (RDL) and solder balls. The objective of this paper is to share the challenges in processing multi-die eWLB packages,...
In this paper, an improved method to investigate the reliability of solder joint between High-power LED chip and heat sink is presented. The power cycling is carried out through the switching on and off of the current stress. The optical and electrical characteristics do not degrade apparently. Electrical method is used to measure the thermal resistance of high-power LED which increases from 15.81°C/W...
This study examines evolution characteristics of inelastic strains and materials damage in Sn-4Ag-0.5Cu (SAC405) solder joints of a BGA package under cyclic mechanical stressing. For this purpose, a finite element model of the assembly under four-point bend test set-up is employed. Strain rate-dependent response of the solder is represented by Anand model. Progressive damage in the solder joint is...
In addressing emerging high speed interface such as USB 2.0, IEEE1394, LVDS and DVI in electronic devices, discrete solution of using choke and ESD diodes is a common practice in the PCB assembly in eliminating the common mode noise and providing ESD protection to the electronice device [1]. However, this brings up the cost and cycle time as PCB manufacturers have to purchase several components and...
In the automotive industry, electronic systems are expected to perform well under harsh reliability conditions. There is an emphasis to continuously develop ball grid array (BGA) IC packages that perform increasingly well with respect to board level temperature cycling reliability. This paper is a study of three No-Clean Polymer Flux (NCPF) materials and evaluation of their performance relative to...
Board level drop test and thermal cycle are the keys qualification tests to ensure the solder joint reliability. It becomes critical due to leadfree solder. The work reported here explores the effect of underfill on drop test and thermal cycle reliability of area array packages, such as BGA's, CSP's, and WLCSP's. An unfilled underfill was found to provide superior drop test performance. Silica filled...
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