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The dramatic increase in leakage current, coupled with the swell in process variability in nano-scaled CMOS technologies, has become a major issue for future IC design. Moreover, due to the spread of leakage power values, leakage variability cannot be neglected anymore. In this work an accurate analytic estimation and modeling methodology has been developed for logic gates leakage under statistical...
This paper addresses the segmentation problem in noisy image based on Fast Edge Integration (FEI) method in active contour model (ACM) and proposes a new statistical active contour model (SACM). Two modifications are performed in FEI method. First, in order to handle noisy images, maximum log-likelihood estimation is used to replace the minimal variance term proposed by Chan and Vese. Second, a penalising...
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