Search results
Nanoscale Research Letters > 2019 > 14 > 1 > 1-7
IEEE Transactions on Electron Devices > 2017 > 64 > 10 > 3991 - 3997
Microelectronics Reliability > 2017 > 76-77 > C > 298-303
Science China Information Sciences > 2016 > 59 > 4 > 1-9
Microelectronics Reliability > 2015 > 55 > 9-10 > 1471-1475
Journal of Central South University > 2015 > 22 > 2 > 552-559
IEEE Electron Device Letters > 2014 > 35 > 12 > 1254 - 1256
IEEE Transactions on Microwave Theory and Techniques > 2013 > 61 > 1-2 > 553 - 561
IEEE Transactions on Device and Materials Reliability > 2011 > 11 > 1 > 118 - 125
IEEE Microwave and Wireless Components Letters > 2011 > 21 > 7 > 374 - 376
IEEE Microwave and Wireless Components Letters > 2010 > 20 > 12 > 678 - 680
IEEE Electron Device Letters > 2010 > 31 > 12 > 1440 - 1442
IEEE Transactions on Electron Devices > 2008 > 55 > 12 > 3507 - 3516
IEEE Transactions on Microwave Theory and Techniques > 2007 > 55 > 12-2 > 2822 - 2831