Search results
Microelectronics Reliability > 2016 > 58 > C > 192-196
IEEE Electron Device Letters > 2014 > 35 > 1 > 117 - 119
IEEE Transactions on Device and Materials Reliability > 2014 > 14 > 4 > 1080 - 1090
Microelectronic Engineering > 2013 > 109 > Complete > 322-325
2013 IEEE International Reliability Physics Symposium (IRPS) > 3A.2.1 - 3A.2.5
Applied Nanoscience > 2013 > 3 > 3 > 235-240
Journal of Computational Electronics > 2013 > 12 > 4 > 638-650
Microelectronic Engineering > 2011 > 88 > 7 > 1380-1383
IEEE Transactions on Electron Devices > 2011 > 58 > 4 > 1084 - 1090
IEEE Transactions on Electron Devices > 2011 > 58 > 9 > 2878 - 2887
Microelectronic Engineering > 2009 > 86 > 10 > 2123-2126
IEEE Transactions on Device and Materials Reliability > 2009 > 9 > 2 > 305 - 310
Thin Solid Films > 2008 > 517 > 1 > 27-30
Microelectronic Engineering > 2008 > 85 > 11 > 2207-2212
Materials Science in Semiconductor Processing > 2008 > 11 > 5-6 > 254-258
IEEE Transactions on Electron Devices > 2008 > 55 > 4 > 997 - 1004