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2011 International Reliability Physics Symposium > EL.3.1 - EL.3.6
IEEE Transactions on Very Large Scale Integration (VLSI) Systems > 2011 > 19 > 4 > 559 - 570
2010 International SoC Design Conference > 372 - 375
2009 International SoC Design Conference (ISOCC) > 295 - 300