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This paper designed a 1-Mb HfOx-based embedded Resistive Random Access Memory (RRAM) device with a one-transistor-one-resistor (1T1R) structure, and systematically investigated its working temperature range. It noted that this embedded RRAM macro has a 1.6X working temperature range than previous design for some extreme environment. Using the peripheral-assisted technique, it can enable the error...
Memristive devices such as memristors that have been intensively studied for their possibilities as a strong candidate for future memories are known to have two problems. First, they need a large current in write operation, and second their process-V -temperature (PVT) variations are large compared with the conventional DRAM and FLASH memories. Moreover, the large writing current can be magnified...
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