Search results
IEEE Transactions on Electron Devices > 2018 > 65 > 1 > 23 - 30
IEEE Transactions on Reliability > 2017 > 66 > 4 > 1266 - 1279
IEEE Transactions on Multi-Scale Computing Systems > 2017 > 3 > 4 > 269 - 282
IEEE Transactions on Reliability > 2017 > 66 > 3 > 641 - 650
IEEE Transactions on Reliability > 2017 > 66 > 3 > 603 - 615
2017 29th Chinese Control And Decision Conference (CCDC) > 6366 - 6369