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We propose a method for diagnosis of parametric faults in analog circuits using polynomial coefficients of the circuit model. As a sequel to our recent work, where circuit response is modeled as polynomial for uncovering parametric faults in nonlinear circuits, we propose diagnosis of such faults using sensitivity of coefficients of the estimated polynomial to circuit parameters. The proposed method...
A method of testing for parametric faults of analog circuits based on a polynomial representation of fault-free function of the circuit is presented. The response of the circuit under test (CUT) is estimated as a polynomial in the applied input voltage at relevant frequencies in addition to DC. Classification of CUT is based on a comparison of the estimated polynomial coefficients with those of the...
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