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This paper is an exposition of recent advances made in polynomial coefficient and V-transform coefficient based testing of parametric faults in linear and non-linear analog circuits. V-transform is a non-linear transform that increases the sensitivity of polynomial coefficients with respect to circuit component variations by three to five times. In addition, it makes the original polynomial coefficients...
A method of testing for parametric faults of analog circuits based on a polynomial representation of fault-free function of the circuit is presented. The response of the circuit under test (CUT) is estimated as a polynomial in the applied input voltage at relevant frequencies in addition to DC. Classification of CUT is based on a comparison of the estimated polynomial coefficients with those of the...
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