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IEEE Transactions on Pattern Analysis and Machine Intelligence > 2012 > 34 > 2 > 240 - 252
IEEE Transactions on Signal Processing > 2018 > 66 > 3 > 698 - 713
IEEE Transactions on Cybernetics > 2018 > 48 > 1 > 2 - 15
IEEE Transactions on Image Processing > 2018 > 27 > 1 > 281 - 292
IEEE Electron Device Letters > 2018 > 39 > 1 > 135 - 138
IEEE Electron Device Letters > 2018 > 39 > 1 > 8 - 11
IEEE Transactions on Information Forensics and Security > 2018 > 13 > 1 > 63 - 78
IEEE Transactions on Cybernetics > 2018 > 48 > 1 > 357 - 370
IEEE Transactions on Cybernetics > 2017 > 47 > 12 > 4509 - 4520
IEEE Systems Journal > 2017 > 11 > 4 > 2128 - 2139
IEEE Transactions on Device and Materials Reliability > 2017 > 17 > 4 > 802 - 804
IEEE Robotics & Automation Magazine > 2017 > 24 > 4 > 116 - 117
IEEE Transactions on Knowledge and Data Engineering > 2017 > 29 > 12 > 2772 - 2785
IEEE Electrification Magazine > 2017 > 5 > 4 > C3
IEEE Transactions on Multimedia > 2017 > 19 > 12 > 2832 - 2845
Electronics Letters > 2017 > 53 > 24 > 1602 - 1604
IEEE Geoscience and Remote Sensing Letters > 2017 > 14 > 11 > 2127 - 2131
IEEE Sensors Journal > 2017 > 17 > 21 > 7074 - 7085