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IEEE Electron Device Letters > 2016 > 37 > 7 > 831 - 834
IEEE Transactions on Electron Devices > 2018 > 65 > 1 > 339 - 346
IEEE Transactions on Electron Devices > 2017 > 64 > 12 > 4831 - 4837
IEEE Transactions on Electron Devices > 2017 > 64 > 12 > 4838 - 4843
IEEE Electron Device Letters > 2017 > 38 > 10 > 1500 - 1503
IEEE Transactions on Electron Devices > 2017 > 64 > 10 > 3998 - 4001
IEEE Transactions on Electron Devices > 2017 > 64 > 9 > 3582 - 3587
IEEE Transactions on Electron Devices > 2017 > 64 > 8 > 3303 - 3307
IEEE Transactions on Electron Devices > 2017 > 64 > 8 > 3316 - 3323
2017 IEEE International Reliability Physics Symposium (IRPS) > FA-5.1 - FA-5.4