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IEEE Transactions on Device and Materials Reliability > 2011 > 11 > 2 > 227 - 235
IEEE Electron Device Letters > 2008 > 29 > 1 > 54 - 56
IEEE Electron Device Letters > 2007 > 28 > 11 > 990 - 992
IEEE Transactions on Device and Materials Reliability > 2011 > 11 > 2 > 227 - 235
IEEE Electron Device Letters > 2008 > 29 > 1 > 54 - 56
IEEE Electron Device Letters > 2007 > 28 > 11 > 990 - 992