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2010 IEEE International Reliability Physics Symposium > 1063 - 1068
2008 IEEE Power Electronics Specialists Conference > 4215 - 4221
IEEE Transactions on Electron Devices > 2008 > 55 > 12 > 3450 - 3458
IEEE Transactions on Device and Materials Reliability > 2006 > 6 > 2 > 334 - 342
IEEE Transactions on Electron Devices > 2006 > 53 > 7 > 1623 - 1633
Electronics Letters > 1992 > 28 > 15 > 1441 - 1442