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IEEE Transactions on Very Large Scale Integration (VLSI) Systems > 2018 > 26 > 1 > 50 - 62
IEEE Transactions on Electron Devices > 2017 > 64 > 10 > 4011 - 4017
IEEE Transactions on Computer-Aided Design of Integrated Circuits and... > 2017 > 36 > 9 > 1557 - 1570
IEEE Transactions on Very Large Scale Integration (VLSI) Systems > 2017 > 25 > 8 > 2271 - 2284
IEEE Transactions on Device and Materials Reliability > 2017 > 17 > 2 > 404 - 413
2017 IEEE International Reliability Physics Symposium (IRPS) > 6A-3.1 - 6A-3.8
2017 IEEE International Reliability Physics Symposium (IRPS) > 2E-4.1 - 2E-4.8