Search results
IEEE Transactions on Very Large Scale Integration (VLSI) Systems > 2017 > 25 > 11 > 3138 - 3151
IEEE Transactions on Computer-Aided Design of Integrated Circuits and... > 2017 > 36 > 10 > 1688 - 1701
IEEE Transactions on Computer-Aided Design of Integrated Circuits and... > 2017 > 36 > 8 > 1265 - 1273
IEEE Design & Test > 2017 > 34 > 3 > 59 - 67
IEEE Transactions on Device and Materials Reliability > 2017 > 17 > 2 > 307 - 315