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IEEE Transactions on Electron Devices > 2017 > 64 > 11 > 4386 - 4392
IEEE Transactions on Dielectrics and Electrical Insulation > 2017 > 24 > 5 > 3099 - 3112
IEEE Transactions on Electron Devices > 2017 > 64 > 9 > 3616 - 3621
IEEE Transactions on Electron Devices > 2017 > 64 > 9 > 3639 - 3646
IEEE Transactions on Electron Devices > 2017 > 64 > 8 > 3132 - 3138
IEEE Transactions on Electromagnetic Compatibility > 2017 > 59 > 3 > 902 - 909
IEEE Transactions on Device and Materials Reliability > 2017 > 17 > 2 > 324 - 330
IEEE Electron Device Letters > 2017 > 38 > 5 > 604 - 606
2017 IEEE International Reliability Physics Symposium (IRPS) > 4C-5.1 - 4C-5.6
2017 IEEE International Reliability Physics Symposium (IRPS) > 3C-2.1 - 3C-2.5
2017 IEEE International Reliability Physics Symposium (IRPS) > 3C-5.1 - 3C-5.6
2017 IEEE International Reliability Physics Symposium (IRPS) > 3C-4.1 - 3C-4.6