Search results
IEEE Transactions on Circuits and Systems II: Express Briefs > 2010 > 57 > 4 > 285 - 289
IEEE Transactions on Device and Materials Reliability > 2009 > 9 > 3 > 476 - 482
IEEE Transactions on Very Large Scale Integration (VLSI) Systems > 2009 > 17 > 6 > 770 - 780
IEEE Transactions on Circuits and Systems I: Regular Papers > 2008 > 55 > 1 > 336 - 346
IEEE Transactions on Neural Networks > 2008 > 19 > 5 > 770 - 781
IEEE Transactions on Very Large Scale Integration (VLSI) Systems > 2006 > 14 > 11 > 1276 - 1281
IEEE Transactions on Very Large Scale Integration (VLSI) Systems > 2004 > 12 > 10 > 1076 - 1080
IEEE Transactions on Very Large Scale Integration (VLSI) Systems > 2002 > 10 > 5 > 560 - 565
IEEE Transactions on Very Large Scale Integration (VLSI) Systems > 2002 > 10 > 3 > 221 - 229
IEEE Transactions on Very Large Scale Integration (VLSI) Systems > 2000 > 8 > 4 > 456 - 460
IEEE Transactions on Very Large Scale Integration (VLSI) Systems > 1999 > 7 > 2 > 280 - 284
IEEE Transactions on Very Large Scale Integration (VLSI) Systems > 1999 > 7 > 4 > 477 - 482
IEEE Transactions on Very Large Scale Integration (VLSI) Systems > 1997 > 5 > 2 > 161 - 174
IEEE Transactions on Very Large Scale Integration (VLSI) Systems > 1996 > 4 > 2 > 247 - 253
IEEE Transactions on Very Large Scale Integration (VLSI) Systems > 1995 > 3 > 2 > 188 - 200
IEEE Transactions on Very Large Scale Integration (VLSI) Systems > 1995 > 3 > 1 > 49 - 58
IEEE Transactions on Very Large Scale Integration (VLSI) Systems > 1995 > 3 > 1 > 141 - 146