Search results
IEEE Transactions on Electron Devices > 2018 > 65 > 1 > 59 - 63
IEEE Transactions on Electron Devices > 2017 > 64 > 12 > 4868 - 4874
IEEE Electron Device Letters > 2017 > 38 > 12 > 1704 - 1707
IEEE Electron Device Letters > 2017 > 38 > 10 > 1445 - 1448
IEEE Transactions on Electron Devices > 2017 > 64 > 9 > 3734 - 3739
IEEE Transactions on Electron Devices > 2017 > 64 > 9 > 3616 - 3621
IEEE Transactions on Electron Devices > 2017 > 64 > 4 > 1642 - 1646
IEEE Transactions on Electron Devices > 2017 > 64 > 3 > 1032 - 1037
IEEE Electron Device Letters > 2017 > 38 > 2 > 240 - 243
IEEE Transactions on Electron Devices > 2017 > 64 > 1 > 78 - 83
IEEE Transactions on Device and Materials Reliability > 2016 > 16 > 4 > 667 - 684
IEEE Photonics Journal > 2016 > 8 > 5 > 1 - 7
IEEE Electron Device Letters > 2016 > 37 > 9 > 1197 - 1200
IEEE Transactions on Device and Materials Reliability > 2016 > 16 > 2 > 213 - 219