Search results
Microelectronics Reliability > 2017 > 69 > C > 47-51
2016 IEEE International Conference on Dielectrics (ICD) > 2 > 1065 - 1068
Thin Solid Films > 2012 > 520 > 15 > 5007-5010
IEEE Transactions on Electron Devices > 2012 > 59 > 12 > 3503 - 3509
2011 International Reliability Physics Symposium > EX.1.1 - EX.1.5
IEEE Transactions on Electron Devices > 2011 > 58 > 1 > 11 - 16
IEEE Transactions on Electron Devices > 2011 > 58 > 10 > 3307 - 3313
IEEE Transactions on Nuclear Science > 2011 > 58 > 6-1 > 2904 - 2910
2010 3rd International Nanoelectronics Conference (INEC) > 1210 - 1211
IEEE Transactions on Electron Devices > 2010 > 57 > 1 > 288 - 296
IEEE Transactions on Nuclear Science > 2009 > 56 > 4-2 > 2218 - 2224