Search results
2017 IEEE International Reliability Physics Symposium (IRPS) > 3C-2.1 - 3C-2.5
2017 IEEE International Reliability Physics Symposium (IRPS) > 3C-5.1 - 3C-5.6
2017 IEEE International Reliability Physics Symposium (IRPS) > 3C-4.1 - 3C-4.6
2017 IEEE International Reliability Physics Symposium (IRPS) > 3C-1.1 - 3C-1.6
IEEE Transactions on Dielectrics and Electrical Insulation > 2017 > 24 > 1 > 656 - 665
IEEE Transactions on Dielectrics and Electrical Insulation > 2017 > 24 > 4 > 2570 - 2578
IEEE Transactions on Device and Materials Reliability > 2016 > 16 > 4 > 455 - 460
IEEE Transactions on Device and Materials Reliability > 2016 > 16 > 3 > 376 - 383
IEEE Transactions on Instrumentation and Measurement > 2016 > 65 > 9 > 2067 - 2077
2016 IEEE International Conference on Dielectrics (ICD) > 2 > 662 - 665
2016 IEEE Electrical Insulation Conference (EIC) > 444 - 447
IEEE Transactions on Electron Devices > 2016 > 63 > 6 > 2384 - 2390
IEEE Electron Device Letters > 2016 > 37 > 5 > 611 - 614
2016 IEEE International Reliability Physics Symposium (IRPS) > 7A-4-1 - 7A-4-7
2016 IEEE International Reliability Physics Symposium (IRPS) > 4C-3-1 - 4C-3-5