Search results
IEEE Transactions on Reliability > 2017 > 66 > 4 > 1025 - 1035
IEEE Transactions on Electromagnetic Compatibility > 2017 > 59 > 5 > 1565 - 1575
2017 IEEE AFRICON > 1485 - 1490
IEEE Transactions on Electron Devices > 2017 > 64 > 8 > 3511 - 3514
IEEE Transactions on Electron Devices > 2017 > 64 > 8 > 3056 - 3062
2017 36th Chinese Control Conference (CCC) > 10761 - 10766