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IEEE Transactions on Electron Devices > 2018 > 65 > 1 > 59 - 63
IEEE Transactions on Electron Devices > 2017 > 64 > 12 > 4868 - 4874
IEEE Transactions on Electron Devices > 2017 > 64 > 11 > 4650 - 4656
IEEE Electron Device Letters > 2017 > 38 > 10 > 1445 - 1448
IEEE Transactions on Electron Devices > 2017 > 64 > 9 > 3609 - 3615
IEEE Transactions on Electron Devices > 2017 > 64 > 7 > 2893 - 2899
IEEE Transactions on Electron Devices > 2017 > 64 > 5 > 2172 - 2178
IEEE Transactions on Electron Devices > 2017 > 64 > 5 > 2155 - 2160
2017 IEEE International Reliability Physics Symposium (IRPS) > 3B-5.1 - 3B-5.5
IEEE Transactions on Electron Devices > 2017 > 64 > 4 > 1548 - 1553
IEEE Transactions on Electron Devices > 2017 > 64 > 3 > 1026 - 1031
IEEE Transactions on Electron Devices > 2017 > 64 > 3 > 840 - 847
IEEE Access > 2017 > 5 > 20946 - 20952