Search results
IEEE Transactions on Electron Devices > 2018 > 65 > 1 > 59 - 63
IEEE Electron Device Letters > 2017 > 38 > 10 > 1441 - 1444
IEEE Transactions on Electron Devices > 2017 > 64 > 5 > 2155 - 2160
2017 IEEE International Reliability Physics Symposium (IRPS) > 4B-3.1 - 4B-3.6
2017 IEEE International Reliability Physics Symposium (IRPS) > WB-2.1 - WB-2.4
IEEE Transactions on Electron Devices > 2017 > 64 > 4 > 1548 - 1553
IEEE Transactions on Electron Devices > 2017 > 64 > 3 > 1045 - 1052
IEEE Transactions on Nuclear Science > 2017 > 64 > 8-1 > 2284 - 2291
IEEE Journal of the Electron Devices Society > 2016 > 4 > 5 > 246 - 252
IEEE Transactions on Nuclear Science > 2016 > 63 > 3-3 > 1918 - 1926
IEEE Transactions on Electron Devices > 2016 > 63 > 4 > 1486 - 1494
IEEE Transactions on Electron Devices > 2016 > 63 > 2 > 723 - 730
2015 IEEE International Reliability Physics Symposium > 6C.4.1 - 6C.4.6
2015 IEEE International Reliability Physics Symposium > 6C.3.1 - 6C.3.4
2015 IEEE International Reliability Physics Symposium > 2E.5.1 - 2E.5.8
2015 IEEE International Reliability Physics Symposium > 2E.3.1 - 2E.3.6
IEEE Electron Device Letters > 2015 > 36 > 2 > 111 - 113