Search results
IEEE Transactions on Electron Devices > 2018 > 65 > 1 > 38 - 44
IEEE Transactions on Electron Devices > 2018 > 65 > 1 > 59 - 63
2017 IEEE International Reliability Physics Symposium (IRPS) > 4B-4.1 - 4B-4.9
2017 IEEE International Reliability Physics Symposium (IRPS) > WB-5.1 - WB-5.5
2017 IEEE International Reliability Physics Symposium (IRPS) > 3B-4.1 - 3B-4.7
IEEE Transactions on Electron Devices > 2016 > 63 > 9 > 3479 - 3486
IEEE Transactions on Electron Devices > 2016 > 63 > 6 > 2334 - 2339
2016 IEEE International Reliability Physics Symposium (IRPS) > 4A-5-1 - 4A-5-6
IEEE Transactions on Electron Devices > 2016 > 63 > 4 > 1486 - 1494
IEEE Transactions on Electron Devices > 2016 > 63 > 4 > 1459 - 1463
IEEE Transactions on Electron Devices > 2016 > 63 > 2 > 723 - 730
IEEE Transactions on Nuclear Science > 2015 > 62 > 6-1 > 2423 - 2430
IEEE Electron Device Letters > 2015 > 36 > 10 > 1011 - 1014
2015 IEEE International Reliability Physics Symposium > 6C.3.1 - 6C.3.4
2015 IEEE International Reliability Physics Symposium > 2E.3.1 - 2E.3.6
IEEE Transactions on Electron Devices > 2014 > 61 > 2 > 437 - 444
IEEE Transactions on Nuclear Science > 2014 > 61 > 6-1 > 2959 - 2964