Search results
IEEE Transactions on Signal Processing > 2018 > 66 > 2 > 278 - 293
IEEE Transactions on Electron Devices > 2018 > 65 > 1 > 199 - 206
IEEE Transactions on Signal Processing > 2017 > 65 > 9 > 2237 - 2246
Microelectronics Reliability > 2017 > 71 > Complete > 35-40
IEEE Transactions on Electromagnetic Compatibility > 2017 > 59 > 2-1 > 498 - 508
IEEE Transactions on Ultrasonics, Ferroelectrics, and Frequency Control > 2017 > 64 > 3 > 617 - 622
IEEE Transactions on Nuclear Science > 2017 > 64 > 1-1 > 204 - 211
IEEE Transactions on Parallel and Distributed Systems > 2016 > 27 > 11 > 3283 - 3297
IEEE Transactions on Device and Materials Reliability > 2016 > 16 > 3 > 282 - 289
IEEE Transactions on Microwave Theory and Techniques > 2016 > 64 > 1 > 125 - 132
IEEE Transactions on Microwave Theory and Techniques > 2016 > 64 > 3 > 756 - 766
IEEE Antennas and Wireless Propagation Letters > 2016 > 15 > 1919 - 1922
IEEE Transactions on Device and Materials Reliability > 2015 > 15 > 4 > 474 - 477
IEEE Transactions on Device and Materials Reliability > 2015 > 15 > 4 > 486 - 494
IEEE Transactions on Electron Devices > 2015 > 62 > 11 > 3825 - 3831
IEEE Electron Device Letters > 2015 > 36 > 10 > 1011 - 1014
IEEE Microwave and Wireless Components Letters > 2015 > 25 > 8 > 550 - 552
IEEE Transactions on Device and Materials Reliability > 2015 > 15 > 1 > 40 - 46
IEEE Electron Device Letters > 2015 > 36 > 2 > 177 - 179
IEEE Journal of Biomedical and Health Informatics > 2015 > 19 > 3 > 901 - 909