Search results
IEEE Transactions on Device and Materials Reliability > 2013 > 13 > 2 > 340 - 349
IEEE Transactions on Very Large Scale Integration (VLSI) Systems > 2013 > 21 > 5 > 821 - 833
IEEE Transactions on Device and Materials Reliability > 2012 > 12 > 2 > 428 - 436
IEEE Transactions on Very Large Scale Integration (VLSI) Systems > 2012 > 20 > 11 > 2143 - 2147
IEEE Transactions on Very Large Scale Integration (VLSI) Systems > 2012 > 20 > 11 > 1951 - 1959
IEEE Transactions on Computers > 2012 > 61 > 9 > 1296 - 1310
IEEE Transactions on Wireless Communications > 2012 > 11 > 1 > 27 - 32
IEEE Transactions on Audio, Speech, and Language Processing > 2012 > 20 > 8 > 2181 - 2190
IEEE Communications Surveys & Tutorials > 2012 > 14 > 2 > 491 - 513
IEEE Transactions on Circuits and Systems I: Regular Papers > 2011 > 58 > 6 > 1239 - 1251
IEEE Signal Processing Letters > 2011 > 18 > 12 > 725 - 728
IEEE Systems Journal > 2011 > 5 > 4 > 486 - 494
IEEE Transactions on Components, Packaging and Manufacturing Technology > 2011 > 1 > 11 > 1718 - 1727
IEEE Transactions on Nanotechnology > 2011 > 10 > 6 > 1249 - 1253
IEEE Transactions on Communications > 2011 > 59 > 5 > 1421 - 1433
IEEE Transactions on Audio, Speech, and Language Processing > 2011 > 19 > 8 > 2516 - 2526
IEEE Journal on Selected Areas in Communications > 2011 > 29 > 5 > 960 - 968
IEEE Transactions on Electron Devices > 2011 > 58 > 10 > 3422 - 3427
IEEE Micro > 2011 > 31 > 6 > 29 - 38
IEEE Transactions on Very Large Scale Integration (VLSI) Systems > 2011 > 19 > 9 > 1681 - 1694