Search results
IEEE Transactions on Circuits and Systems II: Express Briefs > 2016 > 63 > 2 > 156 - 160
IEEE Transactions on Nuclear Science > 2015 > 62 > 6-1 > 2899 - 2905
IEEE Transactions on Nuclear Science > 2012 > 59 > 6-1 > 2888 - 2893
IEEE Transactions on Nuclear Science > 2011 > 58 > 3-3 > 1347 - 1354
IEEE Transactions on Device and Materials Reliability > 2011 > 11 > 1 > 118 - 125
IEEE Transactions on Nuclear Science > 2011 > 58 > 6-1 > 2945 - 2952
IEEE Transactions on Very Large Scale Integration (VLSI) Systems > 2011 > 19 > 3 > 469 - 482
IEEE Transactions on Very Large Scale Integration (VLSI) Systems > 2011 > 19 > 5 > 751 - 762
IEEE Transactions on Nanotechnology > 2011 > 10 > 3 > 433 - 438
IEEE Transactions on Circuits and Systems II: Express Briefs > 2010 > 57 > 10 > 798 - 802
IEEE Electron Device Letters > 2010 > 31 > 9 > 912 - 914
IEEE Electron Device Letters > 2010 > 31 > 8 > 794 - 796
IEEE Transactions on Device and Materials Reliability > 2010 > 10 > 1 > 130 - 141
IEEE Transactions on Device and Materials Reliability > 2010 > 10 > 1 > 92 - 95
IEEE Electron Device Letters > 2010 > 31 > 1 > 83 - 85
IEEE Transactions on Circuits and Systems I: Regular Papers > 2010 > 57 > 7 > 1597 - 1607
IEEE Transactions on Microwave Theory and Techniques > 2010 > 58 > 5-2 > 1401 - 1409
IEEE Journal of Solid-State Circuits > 2010 > 45 > 4 > 707 - 718
Journal of Microelectromechanical Systems > 2010 > 19 > 3 > 548 - 560
IEEE Transactions on Very Large Scale Integration (VLSI) Systems > 2010 > 18 > 3 > 347 - 355