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2017 IEEE International Reliability Physics Symposium (IRPS) > FA-5.1 - FA-5.4
2017 IEEE International Reliability Physics Symposium (IRPS) > 6B-7.1 - 6B-7.6
IEEE Photonics Technology Letters > 2017 > 29 > 7 > 607 - 610
IEEE Electron Device Letters > 2017 > 38 > 4 > 422 - 425
IEEE Transactions on Magnetics > 2017 > 53 > 4-2 > 1 - 8
IEEE Transactions on Device and Materials Reliability > 2017 > 17 > 1 > 106 - 112
IEEE Transactions on Electron Devices > 2017 > 64 > 3 > 969 - 976
IEEE Microwave Magazine > 2017 > 18 > 2 > 74 - 82
IEEE Transactions on Electron Devices > 2017 > 64 > 3 > 1108 - 1113
IEEE Transactions on Electron Devices > 2017 > 64 > 2 > 353 - 360
IEEE Transactions on Electron Devices > 2017 > 64 > 2 > 500 - 506
Biological Trace Element Research > 2017 > 179 > 1 > 79-90
IEEE Transactions on Electron Devices > 2017 > 64 > 1 > 130 - 136
IEEE Electron Device Letters > 2017 > 38 > 1 > 5 - 8
IEEE Journal of Photovoltaics > 2017 > 7 > 1 > 244 - 249
IEEE Antennas and Wireless Propagation Letters > 2017 > 16 > 2844 - 2847
IEEE Transactions on Nuclear Science > 2017 > 64 > 8-2 > 2433 - 2440