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2016 International Electronics Symposium (IES) > 403 - 408
IEEE Transactions on Dependable and Secure Computing > 2016 > 13 > 5 > 547 - 558
Journal of Electronic Testing > 2016 > 32 > 5 > 587-599
2016 International Electronics Symposium (IES) > 403 - 408
IEEE Transactions on Dependable and Secure Computing > 2016 > 13 > 5 > 547 - 558
Journal of Electronic Testing > 2016 > 32 > 5 > 587-599