Szukanie zaawansowane
Szukanie zaawansowane w ludziach
2017 IEEE International Reliability Physics Symposium (IRPS) > 2D-3.1 - 2D-3.5
2017 IEEE International Reliability Physics Symposium (IRPS) > 3E-3.1 - 3E-3.6
2016 IEEE International Reliability Physics Symposium (IRPS) > XT-9-1 - XT-9-4
2015 IEEE International Electron Devices Meeting (IEDM) > 20.2.1 - 20.2.4
2015 IEEE International Reliability Physics Symposium > 4A.4.1 - 4A.4.6
2013 IEEE International Reliability Physics Symposium (IRPS) > 5D.3.1 - 5D.3.5
2012 IEEE International Reliability Physics Symposium (IRPS) > 4C.1.1 - 4C.1.8
IEEE Electron Device Letters > 2011 > 32 > 5 > 605 - 607
IEEE Journal of Solid-State Circuits > 2010 > 45 > 4 > 817 - 829
2009 IEEE Custom Integrated Circuits Conference > 431 - 438