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IEEE Transactions on Device and Materials Reliability > 2017 > 17 > 4 > 600 - 607
IEEE Transactions on Device and Materials Reliability > 2017 > 17 > 4 > 653 - 666
IEEE Transactions on Industry Applications > 2017 > 53 > 6 > 5687 - 5697
IEEE Transactions on Components, Packaging and Manufacturing Technology > 2017 > 7 > 10 > 1634 - 1643
IEEE Transactions on Components, Packaging and Manufacturing Technology > 2017 > 7 > 9 > 1567 - 1577
IEEE Transactions on Components, Packaging and Manufacturing Technology > 2017 > 7 > 8 > 1369 - 1376
IEEE Transactions on Device and Materials Reliability > 2017 > 17 > 2 > 381 - 398
IEEE Electron Device Letters > 2017 > 38 > 1 > 115 - 118
IEEE Transactions on Components, Packaging and Manufacturing Technology > 2017 > 7 > 2 > 229 - 237
IEEE Design & Test > 2016 > 33 > 6 > 23 - 30
IEEE Transactions on Very Large Scale Integration (VLSI) Systems > 2016 > 24 > 11 > 3310 - 3322
IEEE Transactions on Industry Applications > 2016 > 52 > 5 > 3714 - 3728