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IEEE Transactions on Power Electronics > 2018 > 33 > 3 > 2704 - 2713
IEEE Transactions on Information Forensics and Security > 2018 > 13 > 2 > 292 - 305
IEEE Transactions on Industrial Electronics > 2018 > 65 > 2 > 1298 - 1305
IEEE Transactions on Computers > 2018 > 67 > 1 > 102 - 114
IEEE Transactions on Control Systems Technology > 2018 > 26 > 1 > 360 - 367
IEEE Transactions on Pattern Analysis and Machine Intelligence > 2018 > 40 > 1 > 148 - 162
Journal of Lightwave Technology > 2017 > 35 > 23 > 5105 - 5120
IEEE Transactions on Components, Packaging and Manufacturing Technology > 2017 > 7 > 12 > 1940 - 1950
IEEE Transactions on Device and Materials Reliability > 2017 > 17 > 4 > 722 - 726
IEEE Transactions on Very Large Scale Integration (VLSI) Systems > 2017 > 25 > 12 > 3464 - 3472
IEEE Transactions on Electron Devices > 2017 > 64 > 12 > 4861 - 4867
IEEE Life Sciences Letters > 2017 > 3 > 4 > 13 - 16
IEEE Transactions on Device and Materials Reliability > 2017 > 17 > 4 > 773 - 779
IEEE Transactions on Reliability > 2017 > 66 > 4 > 1110 - 1119
IEEE Transactions on Circuits and Systems I: Regular Papers > 2017 > 64 > 12 > 3138 - 3149
IEEE Transactions on Device and Materials Reliability > 2017 > 17 > 4 > 795 - 798
IEEE Transactions on Reliability > 2017 > 66 > 4 > 1157 - 1177
IEEE Transactions on Device and Materials Reliability > 2017 > 17 > 4 > 785 - 794
IEEE Transactions on Parallel and Distributed Systems > 2017 > 28 > 12 > 3521 - 3536
IEEE Transactions on Power Electronics > 2017 > 32 > 12 > 9355 - 9363