Advanced search
Advanced search in people
IEEE Journal of the Electron Devices Society > 2018 > 6 > 1 > 81 - 84
2017 IEEE SENSORS > 1 - 3
IEEE Electron Device Letters > 2017 > 38 > 10 > 1441 - 1444
IEEE Electron Device Letters > 2017 > 38 > 10 > 1445 - 1448
IEEE Transactions on Electron Devices > 2017 > 64 > 7 > 2820 - 2825
IEEE Transactions on Electron Devices > 2017 > 64 > 5 > 2298 - 2305
2017 IEEE International Reliability Physics Symposium (IRPS) > DG-1.1 - DG-1.5
IEEE Transactions on Electron Devices > 2017 > 64 > 4 > 1624 - 1629
IEEE Electron Device Letters > 2017 > 38 > 4 > 501 - 504
IEEE Transactions on Electron Devices > 2017 > 64 > 3 > 832 - 839
IEEE Latin America Transactions > 2017 > 15 > 2 > 324 - 332
IEEE Electron Device Letters > 2017 > 38 > 1 > 16 - 19
IEEE Transactions on Electron Devices > 2017 > 64 > 1 > 73 - 77
IEEE Electron Device Letters > 2016 > 37 > 9 > 1084 - 1087
IEEE Transactions on Electron Devices > 2016 > 63 > 8 > 3076 - 3083