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IEEE Transactions on Electron Devices > 2018 > 65 > 1 > 299 - 307
IEEE Transactions on Electron Devices > 2018 > 65 > 1 > 101 - 107
IEEE Electron Device Letters > 2018 > 39 > 1 > 103 - 106
IEEE Transactions on Electron Devices > 2018 > 65 > 1 > 331 - 338
IEEE Transactions on Device and Materials Reliability > 2017 > 17 > 4 > 692 - 697
IEEE Transactions on Biomedical Circuits and Systems > 2017 > 11 > 6 > 1335 - 1343
IEEE Transactions on Electron Devices > 2017 > 64 > 12 > 5242 - 5248
IEEE Transactions on Electron Devices > 2017 > 64 > 12 > 4985 - 4991
IEEE Electron Device Letters > 2017 > 38 > 12 > 1712 - 1715
IEEE Transactions on Electron Devices > 2017 > 64 > 12 > 5093 - 5098
IEEE Transactions on Nuclear Science > 2017 > 64 > 10 > 2633 - 2638
2017 IEEE SENSORS > 1 - 3
IEEE Electron Device Letters > 2017 > 38 > 9 > 1236 - 1239
IEEE Journal of the Electron Devices Society > 2017 > 5 > 5 > 335 - 339
IEEE Transactions on Electron Devices > 2017 > 64 > 9 > 3534 - 3540