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Using in situ electrical biasing transmission electron microscopy, structural and chemical modification to n–i–p‐type MAPbI3 solar cells are examined with a TiO2 electron‐transporting layer caused by bias in the absence of other stimuli known to affect the physical integrity of MAPbI3 such as moisture, oxygen, light, and thermal stress. Electron energy loss spectroscopy (EELS) measurements reveal...
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