The leakage behaviors of ferroelectric layered-perovskite (Bi3.15Nd0.85)Ti3O12 (BNdT) thin films deposited on Pt/TiO2/Ti/Si substrates by RF sputtering have been carefully investigated. Their I–V curves exhibit a rich diversity of conducting behaviors at different temperature and voltage ranges, which may be accounted for by various conducting mechanisms, including Ohmic behavior, Schottky emission, space-charge-limited current (SCLC), and Fowler-Nordheim tunneling effects. Their time-dependent leakage currents show a nearly linear relationship with respect to logarithmic relaxation time at initial stage (<100 s) as can be ascribed to a dielectric relaxation process, while a small cusp appears at prolonged relaxation time (>400 s) showing characteristics of ionic space-charge limit current relaxation.