Journal of Electronic Testing
Journal of Electronic Testing > 2008 > 24 > 1-3 > 35-44
Journal of Electronic Testing > 2008 > 24 > 1-3 > 11-19
Journal of Electronic Testing > 2008 > 24 > 1-3 > 83-92
Journal of Electronic Testing > 2008 > 24 > 1-3 > 21-33
Journal of Electronic Testing > 2008 > 24 > 1-3 > 157-163
Journal of Electronic Testing > 2008 > 24 > 1-3 > 203-222
Journal of Electronic Testing > 2008 > 24 > 1-3 > 181-192
Journal of Electronic Testing > 2008 > 24 > 1-3 > 193-201
Journal of Electronic Testing > 2008 > 24 > 1-3 > 105-116
Journal of Electronic Testing > 2008 > 24 > 1-3 > 223-233
Journal of Electronic Testing > 2008 > 24 > 1-3 > 165-179
Journal of Electronic Testing > 2008 > 24 > 1-3 > 313-320
Journal of Electronic Testing > 2008 > 24 > 1-3 > 93-103
Journal of Electronic Testing > 2008 > 24 > 1-3 > 143-155
Journal of Electronic Testing > 2008 > 24 > 1-3 > 285-296
Journal of Electronic Testing > 2008 > 24 > 1-3 > 271-284
Journal of Electronic Testing > 2008 > 24 > 1-3 > 235-246
Journal of Electronic Testing > 2008 > 24 > 1-3 > 67-81