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Conventionally, circuits are designed to add pessimistic timing margin to solve delay variation problems, which guarantees “always correct” operations. However, due to the fact that such a worst-case condition occurs rarely, the traditional pessimistic design method is therefore becoming one of the main obstacles for designers to achieve higher performance and/or ultra-low power consumption. By monitoring...
The inherent problem in signal probability (α) prediction has limited the scope of exploiting the transistor's BTI recovery at circuit level. In this paper, we present a design-for-reliability (DFR) methodology for digital designs, BTI_Refresh, that instead of relying on predicting α, sets it to a known value (∼0.5) such that the BTI stress effects are alleviated and a predicted recovery effect could...
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