IEEE Journal of the Electron Devices Society
IEEE Journal of the Electron Devices Society > 2013 > 1 > 1 > 21 - 27
IEEE Journal of the Electron Devices Society > 2014 > 2 > 4 > 59 - 64
IEEE Journal of the Electron Devices Society > 2014 > 2 > 4 > 65 - 76
IEEE Journal of the Electron Devices Society > 2014 > 2 > 6 > 187 - 190
IEEE Journal of the Electron Devices Society > 2014 > 2 > 6 > 135 - 144
IEEE Journal of the Electron Devices Society > 2014 > 2 > 6 > 179 - 181
IEEE Journal of the Electron Devices Society > 2015 > 3 > 2 > 73 - 77
IEEE Journal of the Electron Devices Society > 2015 > 3 > 3 > 233 - 239
IEEE Journal of the Electron Devices Society > 2015 > 3 > 3 > 122 - 134
IEEE Journal of the Electron Devices Society > 2015 > 3 > 4 > 377 - 381
IEEE Journal of the Electron Devices Society > 2015 > 3 > 5 > 383 - 396
IEEE Journal of the Electron Devices Society > 2015 > 3 > 5 > 410 - 417
IEEE Journal of the Electron Devices Society > 2016 > 4 > 2 > 83 - 89
IEEE Journal of the Electron Devices Society > 2016 > 4 > 4 > 169 - 173
IEEE Journal of the Electron Devices Society > 2016 > 4 > 4 > 179 - 184
IEEE Journal of the Electron Devices Society > 2016 > 4 > 5 > 227 - 235
IEEE Journal of the Electron Devices Society > 2016 > 4 > 6 > 485 - 489
IEEE Journal of the Electron Devices Society > 2016 > 4 > 6 > 459 - 465
IEEE Journal of the Electron Devices Society > 2016 > 4 > 6 > 451 - 458
IEEE Journal of the Electron Devices Society > 2017 > 5 > 1 > 59 - 63