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The theme for Autotestcon 2010 is “45 Years of Support Innovation - Moving Forward at the Speed of Light." This theme is particularly relevant for military ATE systems because it highlights the dichotomy of striving to maintain state-of-the-art testing capabilities, while at the same time needing to support legacy technologies that may be decades old - indeed, as old as Autotestcon itself. The...
Of all types of test applications, none require higher reliability, greater customization, more application-specific protocols and interfaces, and higher performance for more complete test coverage than military and aerospace test systems. These requirements often dictate custom hardware and HDL-based FPGA programming which drive higher costs, greater development time, more maintenance, and require...
Digital Signal Processing (DSP) has revolutionized spectral analysis. Where the swept spectrum analyzer dominated the market in the past, the Fast Fourier Transform (FFT) based spectrum analyzer is now gaining acceptance as the method of choice. This is due in part to the prevalence of high speed, high dynamic range Analog-to-Digital Converters (ADC) and high speed signal processing devices such as...
This paper presents the design, test, and results of a highly accelerated life test (HALT) evaluation of a soft-core called Solder Joint Built-in Self-Test™ (SJ BIST™), a method for detecting faults caused by solder-joint fractures in monitored input/output (I/O) pins of field programmable gate array (FPGA) devices, especially those in ball grid array (BGA) type of packages. Modern electronics utilize...
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