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To address key challenges in transistor scaling [1,2], we have used 3D oxide bonding technology in a new way, to fabricate CMOS devices and circuits in which the gate is on the opposite side of the channel from the contacts between the FET and the first wiring level (Ml).
We present a novel method to realize 3D adiabatically Spot-Size Converter (SSC) structures by standard silicon micromachining technics, for efficient coupling from single-mode fiber or free-space to silicon photonic chip. The SSC is comprised of I/O waveguides and a 3D tapered coupler on silicon-on-insulator (SOI) substrate. The dimensions are decreased linearly in both vertical and horizontal directions...
This paper describe the process and test results after single tier circuit fabrication as well as after three-tier integration, determine impact of 3D vias on ring oscillator performance, and demonstrate functionality of single and multi-tier circuits of varying complexity.
Three topologies to globally distribute a clock signal in 3-D circuits have been evaluated. A 3-D test circuit, based on the MITLL 3-D IC manufacturing process, has been designed, fabricated, and measured and is shown to operate at 1.4 GHz. Clock skew measurements indicate that a topology that combines the symmetry of an H-tree on the second plane and local meshes on the other two planes will result...
The challenges of device scaling and short channel effects have necessitated the close examination of 3 dimensional processing. While this certainly comes with challenges in processing and metrology, it also comes with opportunities for new device paradigms and analysis methods. We will look at an historical perspective of 3D processing and further examine how to accurately ldquothinkrdquo 3D to achieve...
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