The Infona portal uses cookies, i.e. strings of text saved by a browser on the user's device. The portal can access those files and use them to remember the user's data, such as their chosen settings (screen view, interface language, etc.), or their login data. By using the Infona portal the user accepts automatic saving and using this information for portal operation purposes. More information on the subject can be found in the Privacy Policy and Terms of Service. By closing this window the user confirms that they have read the information on cookie usage, and they accept the privacy policy and the way cookies are used by the portal. You can change the cookie settings in your browser.
Microelectronic encapsulants exhibit evolving properties that change significantly with environmental exposures such as isothermal aging and thermal cycling. Such aging effects are exacerbated at higher temperatures typical of thermal cycling qualification tests for harsh environment electronic packaging. In this work, the material behavior changes occurring in flip chip underfill encapsulants (silica...
The problem of solder joint fatigue is essentially one of fatigue crack growth. However, little work has been done that enables fatigue life predictions by means of tracking the crack front and its growth. Most popular fatigue life models are empirical and therefore, limited in their applicability and in the insight they provide. Analytical fracture mechanics approaches such as the Paris Law and the...
The problem of solder joint fatigue is essentially one of fatigue crack growth. However, little work has been done that enables fatigue life predictions by means of tracking the crack front and its growth. Most popular fatigue life models are empirical and therefore, limited in their applicability and in the insight they provide. Analytical fracture mechanics approaches such as the Paris law and the...
Sintered nanoscale silver paste was used as thermal interface material in an electronic package. Based on the microstructure of the sintered silver paste, die shear stress-strain curves and thermal cycling test results, a model combined with the model of Navarro-de los Rios and small cracks interaction physical model is put forward to predict the thermal fatigue lifetime of the sintered nanoscale...
Set the date range to filter the displayed results. You can set a starting date, ending date or both. You can enter the dates manually or choose them from the calendar.