IEEE Transactions on Device and Materials Reliability
IEEE Transactions on Device and Materials Reliability > 2011 > 11 > 1 > 141 - 147
IEEE Transactions on Device and Materials Reliability > 2011 > 11 > 1 > 157 - 163
IEEE Transactions on Device and Materials Reliability > 2011 > 11 > 2 > 236 - 243
IEEE Transactions on Device and Materials Reliability > 2012 > 12 > 1 > 158 - 165
IEEE Transactions on Device and Materials Reliability > 2012 > 12 > 2 > 323 - 334
IEEE Transactions on Device and Materials Reliability > 2013 > 13 > 1 > 272 - 276
IEEE Transactions on Device and Materials Reliability > 2013 > 13 > 1 > 322 - 326
IEEE Transactions on Device and Materials Reliability > 2013 > 13 > 1 > 327 - 329
IEEE Transactions on Device and Materials Reliability > 2014 > 14 > 1 > 21 - 29
IEEE Transactions on Device and Materials Reliability > 2014 > 14 > 1 > 446 - 450
IEEE Transactions on Device and Materials Reliability > 2014 > 14 > 1 > 555 - 563
IEEE Transactions on Device and Materials Reliability > 2014 > 14 > 1 > 390 - 399
IEEE Transactions on Device and Materials Reliability > 2014 > 14 > 1 > 146 - 153
IEEE Transactions on Device and Materials Reliability > 2014 > 14 > 4 > 1080 - 1090
IEEE Transactions on Device and Materials Reliability > 2014 > 14 > 4 > 1061 - 1067
IEEE Transactions on Device and Materials Reliability > 2016 > 16 > 1 > 50 - 60
IEEE Transactions on Device and Materials Reliability > 2016 > 16 > 2 > 105 - 111
IEEE Transactions on Device and Materials Reliability > 2016 > 16 > 3 > 318 - 325
IEEE Transactions on Device and Materials Reliability > 2016 > 16 > 3 > 336 - 344
IEEE Transactions on Device and Materials Reliability > 2016 > 16 > 3 > 326 - 335