IEEE Transactions on Device and Materials Reliability
IEEE Transactions on Device and Materials Reliability > 2006 > 6 > 2 > 221 - 227
IEEE Transactions on Device and Materials Reliability > 2006 > 6 > 3 > 479 - 485
IEEE Transactions on Device and Materials Reliability > 2006 > 6 > 4 > 500 - 508
IEEE Transactions on Device and Materials Reliability > 2006 > 6 > 4 > 564 - 574
IEEE Transactions on Device and Materials Reliability > 2007 > 7 > 2 > 340 - 346
IEEE Transactions on Device and Materials Reliability > 2008 > 8 > 2 > 248 - 254
IEEE Transactions on Device and Materials Reliability > 2008 > 8 > 2 > 255 - 264
IEEE Transactions on Device and Materials Reliability > 2008 > 8 > 2 > 272 - 276
IEEE Transactions on Device and Materials Reliability > 2008 > 8 > 2 > 265 - 271
IEEE Transactions on Device and Materials Reliability > 2008 > 8 > 2 > 332 - 343
IEEE Transactions on Device and Materials Reliability > 2008 > 8 > 2 > 240 - 247
IEEE Transactions on Device and Materials Reliability > 2008 > 8 > 2 > 323 - 331
IEEE Transactions on Device and Materials Reliability > 2008 > 8 > 2 > 239
IEEE Transactions on Device and Materials Reliability > 2008 > 8 > 3 > 608 - 620
IEEE Transactions on Device and Materials Reliability > 2010 > 10 > 1 > 82 - 86
IEEE Transactions on Device and Materials Reliability > 2010 > 10 > 1 > 164 - 170
IEEE Transactions on Device and Materials Reliability > 2010 > 10 > 2 > 287 - 294
IEEE Transactions on Device and Materials Reliability > 2010 > 10 > 3 > 360 - 365
IEEE Transactions on Device and Materials Reliability > 2011 > 11 > 1 > 76 - 80
IEEE Transactions on Device and Materials Reliability > 2011 > 11 > 1 > 187 - 193