IEEE Transactions on Device and Materials Reliability
IEEE Transactions on Device and Materials Reliability > 2006 > 6 > 3 > 448 - 454
IEEE Transactions on Device and Materials Reliability > 2008 > 8 > 1 > 47 - 61
IEEE Transactions on Device and Materials Reliability > 2008 > 8 > 1 > 210 - 215
IEEE Transactions on Device and Materials Reliability > 2008 > 8 > 3 > 590 - 599
IEEE Transactions on Device and Materials Reliability > 2009 > 9 > 2 > 171 - 179
IEEE Transactions on Device and Materials Reliability > 2009 > 9 > 2 > 269 - 278
IEEE Transactions on Device and Materials Reliability > 2009 > 9 > 2 > 147 - 162
IEEE Transactions on Device and Materials Reliability > 2009 > 9 > 2 > 318 - 324
IEEE Transactions on Device and Materials Reliability > 2009 > 9 > 2 > 203 - 208
IEEE Transactions on Device and Materials Reliability > 2009 > 9 > 2 > 215 - 221
IEEE Transactions on Device and Materials Reliability > 2009 > 9 > 4 > 524 - 528
IEEE Transactions on Device and Materials Reliability > 2010 > 10 > 2 > 233 - 237
IEEE Transactions on Device and Materials Reliability > 2010 > 10 > 2 > 222 - 232
IEEE Transactions on Device and Materials Reliability > 2010 > 10 > 2 > 174 - 181
IEEE Transactions on Device and Materials Reliability > 2010 > 10 > 3 > 307 - 316
IEEE Transactions on Device and Materials Reliability > 2010 > 10 > 4 > 460 - 475
IEEE Transactions on Device and Materials Reliability > 2011 > 11 > 1 > 201 - 203
IEEE Transactions on Device and Materials Reliability > 2011 > 11 > 1 > 112 - 117
IEEE Transactions on Device and Materials Reliability > 2011 > 11 > 1 > 126 - 130
IEEE Transactions on Device and Materials Reliability > 2011 > 11 > 1 > 118 - 125