IEEE Transactions on Electron Devices
IEEE Transactions on Electron Devices > 2017 > 64 > 4 > 1624 - 1629
IEEE Transactions on Electron Devices > 2017 > 64 > 4 > 1418 - 1425
IEEE Transactions on Electron Devices > 2017 > 64 > 4 > 1528 - 1534
IEEE Transactions on Electron Devices > 2017 > 64 > 4 > 1591 - 1596
IEEE Transactions on Electron Devices > 2017 > 64 > 4 > 1535 - 1540
IEEE Transactions on Electron Devices > 2017 > 64 > 4 > 1702 - 1707
IEEE Transactions on Electron Devices > 2017 > 64 > 4 > 1554 - 1560
IEEE Transactions on Electron Devices > 2017 > 64 > 4 > 1548 - 1553
IEEE Transactions on Electron Devices > 2017 > 64 > 4 > 1575 - 1582
IEEE Transactions on Electron Devices > 2017 > 64 > 4 > 1489 - 1497
IEEE Transactions on Electron Devices > 2017 > 64 > 4 > 1851 - 1856
IEEE Transactions on Electron Devices > 2017 > 64 > 4 > 1619 - 1623
IEEE Transactions on Electron Devices > 2017 > 64 > 4 > 1689 - 1694
IEEE Transactions on Electron Devices > 2017 > 64 > 4 > 1723 - 1727
IEEE Transactions on Electron Devices > 2017 > 64 > 4 > 1498 - 1504
IEEE Transactions on Electron Devices > 2017 > 64 > 4 > 1647 - 1652
IEEE Transactions on Electron Devices > 2017 > 64 > 4 > 1868 - 1872
IEEE Transactions on Electron Devices > 2017 > 64 > 4 > 1674 - 1682
IEEE Transactions on Electron Devices > 2017 > 64 > 4 > C2